Your Shopping Cart is empty.


Download sample
File Details
Published: 2026-10-14 20:25:56.440256 Category: Technology Type: Photo Model release: No
Share
       

Event based vision sensor die detecting microsecond contrast changes in optical laboratory cleanroom for high speed computer vision

Contributor: Vantage BI & AI
ID : 2224639018
TitleFilesize
Photo10072x5664


Buy on Adobe Stock
Keywords
contrast, microchip, semiconductor, integrated circuit, testing, artificial intelligence, robotic, laboratory, technology, innovation, copy space, presentation background, no people


Related items