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Published: 2026-01-26 20:58:25.053838 Category: Technology Type: Photo Model release: No
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SiCやGaN基板を扱う高耐圧工程の真空チャックと検査光学

Contributor: bephoto
ID : 1890562966
TitleFilesize
Photo4000x2267


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Keywords
semiconductor, stage, lens, zip, inspection, operation, clean room, factory, reflex, grating, vacuum, motor, sensor, cable, lighting, luster, macro, textured, quality control, automation, rig, mechanism, static, looking-glass, industry, technology, japan


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